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yyyyyy x. yyyyyy                                                    0000 xxxxxx xxxx , xxxx , xxxxx 00000

(xxx-xxx-xxxx

abc@xyz.com

 

objective

material science and engineering ph.d eager to contribute technical expertise in failure analysis, materials reliability and semiconductors/microelectronics as well as dynamic project management, leadership and client relation skills toward supporting operations of a progressive organization.

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career profile

ø  postdoctoral research centered on materials characterization.

ø  ph.d, science and engineering of materials.

ø  m.s., materials science and engineering.

ø  b.s., physical chemistry.

ø  over 13 years of background in specialty engineering and project management.

ø  knowledgeable in inspection/analysis of prohibited materials for satellite and space applications.

ø  skilled in oversight of critical fa/reliability projects.

ø  background covering integrated microelectronic devices, components and hardware.

ø  proficient in use of advance engineering software applications.

ø  adept in xrf spectral analysis.

ø  strong team leader who has provided exceptional performance on key projects for leading high tech manufacturers.

ø  record of progression to positions of increasing authority and responsibility.

ø  expertise in project management, consulting and cost control.

ø  skilled presenter and facilitator.

ø  strong focus on quality and meeting organizational objectives.

ø  well-organized multi-tasker with exceptional detail orientation.

 

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professional experience

raytheon, el segundo, ca                                                                                                         2007 - present

engineering specialist

       returned to raytheon after previous contract assignment (see below).

       conduct in-depth inspection of prohibited materials (pmi) for satellites and space applications.

       deliver detailed xrf spectral analysis of space-qualified, integrated microelectronic devices and components/hardware.

       ensure xrf inspection of prohibited materials.

       designated to train team members in operation of xrf inspection equipment.

       direct inspection team on xrf and prohibited materials evaluation.

 

arasor international ltd., (china), mountain view, ca                                                                                 2007

fa/reliability project manager

       retained to orchestrate fa/reliability projects for electronic and optoelectronic products.

       managed failure analysis/quality/reliability issues with r&d, production and quality groups.

       facilitated external analytical service labs for fa testing.

       designed and launched build-up of materials process and analysis laboratory for arasor china.

 

raytheon, el segundo, ca                                                                                                            2005 - 2006

engineering specialist

       recruited to deliver technical expertise on prohibited materials evaluation for space flight qualification.

       conducted detailed xrf spectral analysis of space qualified hardware, integrated microelectronic devices and components.

       spearheaded xrf inspection of prohibited materials with bench-top xrf and hand-hold xrf.

 

yyyyyy x. yyyyyy

page two

 

sirenza mocro device, inc., location                                                                                             2002 - 2003

senior reliability engineer

       tasked to conduct failure analysis on rf power amplifier products.

       effectively supported objective of improving product reliability and performance of gaas hbt, sige hbts and operating fa tools including real time x-ray, c-sam, fib, sem/edx and photo emission microscope.

       aided reliability/failure analysis of gaas and sige hbts.

       analyzed and resolved failure mechanisms of hbts related to device packaging and esd.

 

filtronic solid state, location                                                                                                                 2001

senior reliability/failure analysis engineer

       hired to provide assistance to reliability and qualification group.

       examined failure analysis of gaas p-hemt power transistors, packaging and soldering.

       performed electrical/physical failure analysis on rf power amplifier including c-sam, photon emission microscope, while performing rf/dc, fib sem/edx, real-time x-ray imaging and c-sam.

       originated and facilitated fa reports and presentations to customers.

 

silicon motion, inc., location                                                                                                        2000 - 2001

failure analysis engineer

       assigned duties for silicon motion's failure analysis issues.

       successfully set-up fa laboratory and facilities.

       directed sem/edx, fib and thermal imaging, c-sam, real time x-ray imaging and x-section sem sample preparation.

       managed bga packaging and soldering/related failure resolution.

       coordinated with production and qualification groups on yield improvements.

       authored fa reports and component reliability models.

       evaluated competing failure modes leading to optimization of test plans.

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earlier background

prior to 2000, served as senior fa engineer, accurel systems, and senior fa engineer, philips semiconductors. in these assignments, developed outstanding failure analysis, circuit repair, sample preparation, wafer fabrication, process control, engineering staff supervision and problem-solving skill sets.

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education

arizona state university, center for solid state science

post-doctoral, 1994

conducted post-doctoral research projects on materials characterization of ceramic materials including barium titanate, doped ceria and zirconia for fuel cells. defected characterization of gaas by rem and electron energy loss spectroscopy (eels).  studied domains and defects in ceramics and c nanotubes by tem and sem.

 

ph.d, science and engineering of materials, 1993

dissertation research on electron optics, ceramic materials including barium titanate, zirconia, high-resolution tem study of domain structures in ferroelectric ceramics for non-volatile memory devices (feram) and reflection electron microscopy (rem) of ferroelectric domain boundaries. characterization of thin film and nano-crystalline materials by high-resolution tem, experience on vacuum deposition, single crystal growth and preparation of single crystal films, xrf, experience on vacuum systems and thin film depositions.

 

state university of new york at stony brook

m.s., materials science and engineering, 1988

thesis research on metals and semiconductors by x-ray photoelectron spectroscopy (xps) and auger electron spectroscopy (aes).

 

beijing university of science and engineering

b.s., physical chemistry, 1983 

 

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